Equipment Name: Semiconductor Power Device Dynamic Testing System

Manufacturer: ITC

Function Introduction:

This device is used to test the dynamic parameters of power devices, such as switching time, gate charge, reverse recovery time, short-circuit tolerance, and other parameters

Performance Overview:

Maximum voltage 1200Vdc, maximum current 200A; short-circuit withstand peak current 400A

Equipment Name: Static Testing System for Semiconductor Power Devices

Manufacturer: Tesec

Function Introduction:

This device is used to test the static parameters of power devices, such as breakdown voltage , threshold current , leakage current , conduction resistance, etc

Performance Overview:

Maximum voltage 1200V, current 200A

Equipment Name: Semiconductor Power Device Dynamic Testing System

Manufacturer: Tesec

Function Introduction:

This device is used to test the dynamic parameters of power devices, such as resistive switching time, inductive switching time, reverse recovery, etc

Performance Overview:

Maximum voltage 1500V, current 300A

Equipment Name: Thermal Resistance Testing System for Semiconductor Power Devices

Manufacturer: Tesec

Function Introduction:

This device is used to test the transient thermal resistance of power devices

Performance Overview:

Maximum voltage 200V，current 50A

Equipment Name: Steady State Thermal Resistance Testing System

Manufacturer:ANALYSIS TECH

Function Introduction:

This device is used to test the steady-state thermal resistance, transient thermal resistance, structural function, safe working area, etc. of power devices

Performance Overview:

Maximum voltage 50V，current 20A，Delay time less than40us

Equipment Name: Avalanche Energy Testing System for Semiconductor Power Devices

Manufacturer: ITC

Function Introduction:

This device is used to test the avalanche resistance of power devices

Performance Overview:

Avalanche detection voltage 2500V, current 400A; 0.001~159.9mH variable inductance box

Equipment Name: Avalanche Energy Testing System for Semiconductor Power Devices

Manufacturer: Tesec

Function Introduction:

This device is used to test the avalanche resistance of power devices

Performance Overview:

voltage 200V，current 100A

Equipment Name: Gate Charge Testing System for Semiconductor Power Devices

Manufacturer:ITC

Function Introduction:

This device is used to test the gate charge of power devices

Performance Overview:

Maximum voltage 100V，current 100A

Equipment Name: High Power Semiconductor Tube Characteristics Diagram Instrument

Manufacturer: XINJIANG in Shanghai

Function Introduction:

This device is used to test the output characteristic curve, breakdown curve, etc. of power devices

Performance Overview:

voltage Max 2000V  current 20A

Equipment Name: High voltage High Current Diagram Instrument

Manufacturer:IWATSU

Function Introduction:

This device is used to test various power device characteristic curves such as output characteristic curve, breakdown curve, threshold voltage curve, etc

Performance Overview:

voltage Max 3000V，current 400A

Equipment name: 8-inch semi-automatic testing probe station

Manufacturer:America Teala

Function Introduction:

This device is used in conjunction with semiconductor power device static testing systems and graphic devices to test the static parameters of wafers

Performance Overview:

8-inch and 6-inch compatible; Temperature range of testing platform: -60 ℃ -200 ℃; Magnetic probe holder: 4 pieces

Platform Max supports voltage ： 10KV

Equipment Name: Small Probe Station

Manufacturer: Shenzhen Silicon Electric

Function Introduction:

This device is used in conjunction with a static testing system for semiconductor power devices to test the static parameters of wafers

Performance Overview:

Suitable for automatic testing of 6-inch probe stations

Equipment Name: LCR Testing System

Manufacturer: HP

Function Introduction:

This device is used to test the capacitance, inductance, and resistance of power devices

Performance Overview:

Max bias voltage 100V

Equipment Name: Agilent Precision LCR Meter

Manufacturer: Agilent

Function Introduction:

This device is used to test the capacitance, inductance, and resistance of power devices

Performance Overview:

Maximum voltage 200V，Frequency range 75k-30MHz

Equipment Name: Ultra Low Temperature Chamber

Manufacturer: Zhongke Meiling

Function Introduction:

This device is used to analyze the low-temperature characteristics of components

Performance Overview:

Temperature ranges from -60 ℃ to 0 ℃

Equipment Name: Reliability Comprehensive Testing and Analysis System

Manufacturer: Chinese Academy of Sciences

Function Introduction:

This device is used to test parameters such as peak junction temperature, peak thermal resistance, and junction temperature distribution of power devices

Performance Overview:

Measure current adjustable from 1mA to 100mA, with at least 8 adjustable steps; Applied power range: voltage 1-200V, current 1mA-5A

Equipment Name: Semiconductor Power Device Dynamic Testing System

Manufacturer: Japan Tesec

Function Introduction:

This device is used to test the dynamic parameters of power devices, such as inductive switching time, reverse recovery, short-circuit tolerance, etc

Performance Overview:

Switch parameters and Trr testing capability: voltage 1500V current 300A Short circuit withstand: voltage 1500V current 2000A

Equipment Name: Nuotai Sorting Machine

Manufacturer: Shenzhen Nuotai

Function Introduction:

This device is used for automatic testing of power devices in various packaging forms

Performance Overview:

Testeable packaging forms include TO-220/TO-247/TO-264

Equipment Name: High voltage Static Testing System for Semiconductor Power Devices

Manufacturer:Wen Micro

Function Introduction:

This device can be used to test the static parameters of semiconductor power devices, such as breakdown voltage , threshold current, leakage current, on resistance, etc

Performance Overview:

Maximum voltage 10000V  Max current 3000A

Equipment Name: Static Testing System for Semiconductor Power Devices

Manufacturer:AmericaSTI

Function Introduction:

This device is used to test the static parameters of power devices, such as breakdown voltage , threshold current, leakage current, on resistance, etc

Performance Overview:

Maximum voltage 2000V Max current 100A